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Institutional development · Research, innovation and assessment · Germany

Fraunhofer and University of Münster develop wafer process for angle-sensitive silicon diode

Fraunhofer researchers and the University of Münster have developed a wafer-based manufacturing process for a silicon diode that measures by angle, with the international KATRIN neutrino-mass experiment named as a possible use.

Photo: Dietmar Rabich / Wikimedia Commons, CC BY-SA 4.0

Why it matters: The University of Münster now holds structured detector wafers from Fraunhofer IZM for further investigation, with the KATRIN experiment named as a potential application.

Fraunhofer researchers, working with the University of Münster, have developed a wafer-based fabrication process for a new type of silicon diode that measures according to angle, the announcement said.

According to the researchers, the energy-filter diode is intended to help separate signal electrons from background electrons that reach a detector with almost the same energy but at different angles.

The international KATRIN experiment, which aims to determine the mass of the neutrino, is cited as one possible application.

In the Fraunhofer IZM cleanroom, deep honeycomb-shaped microstructures were introduced into large-area detector wafers, electrically passivated and handed to the University of Münster for further study.

Editor’s view

Rachel Smith, Students and International Editor

The University of Münster now holds the structured, passivated wafers for further investigation; the diode is intended to separate signal from background electrons, with the KATRIN experiment named as one possible use.

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